{"product_id":"9780367607098","title":"Thermal-Aware Testing of Digital VLSI Circuits and Systems","description":"This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system levelDescribes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniquesThis book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips","brand":"Santanu Chattopadhyay","offers":[{"title":"Default Title","offer_id":45765576491326,"sku":"9780367607098","price":1431.58,"currency_code":"ZAR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0784\/4357\/7662\/products\/9780367607098.jpg?v=1707247858","url":"https:\/\/exclusivebooks.co.za\/products\/9780367607098","provider":"Exclusive Books Online","version":"1.0","type":"link"}