{"product_id":"9780471584896","title":"Electromigration and Electronic Device Degradation","description":"Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.","brand":"A Christou","offers":[{"title":"Default Title","offer_id":45776998105406,"sku":"9780471584896","price":9051.0,"currency_code":"ZAR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0784\/4357\/7662\/products\/9780471584896_d6468ae3-c67e-4332-bd97-cc470924eed0.jpg?v=1707257798","url":"https:\/\/exclusivebooks.co.za\/products\/9780471584896","provider":"Exclusive Books Online","version":"1.0","type":"link"}