This unique volume presents chapters written on the areas of life-testing and reliability by many well-known researchers who have contributed significantly to these two areas over the years. Chapters cover a wide range of topics such as inference under censoring and truncation, reliability growth models, designs to improve quality, prediction techniques, Bayesian analysis of reliability, multivariate methods, accelerated testing, and more. The book is written in an easy-to-follow style, first presenting the necessary theoretical details and then illustrating the methods with a numerical examples wherever possible. Many tables and graphs that are essential for the use of some of the new methodologies are presented throughout the volume. Numerous examples provide the reader with a clear understanding of the methods presented as well as with insight into the applications of these results.
Format:
CONTRIBUTORS: N. Balakrishnan, H. Leon Harter, Jon E. Anderson, Ananda Sen, Claudio Benski, William Q. Meeker, Philip Prescott, Richard L. Smith, J.R.M. Hosking, Gary C. McDonald
EAN: 9780367449100
COUNTRY: United Kingdom
PAGES:
WEIGHT: 453 g
HEIGHT: 254 cm
PUBLISHED BY: Taylor & Francis Ltd
DATE PUBLISHED: 2019-12-02
CITY:
GENRE: MATHEMATICS / Probability & Statistics / General
WIDTH: 178 cm
SPINE:
Book Themes:
Quality Assurance (QA) and Total Quality Management (TQM), Probability and statistics, Industrial quality control
