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Failure Analysis of Integrated Circuits

Lawrence C. Wagner
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      This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
      Format: Paperback / softback CONTRIBUTORS: Lawrence C. Wagner EAN: 9781461372318 COUNTRY: United States PAGES: WEIGHT: 421 g HEIGHT: 235 cm
      PUBLISHED BY: Springer-Verlag New York Inc. DATE PUBLISHED: 2012-11-09 CITY: GENRE: TECHNOLOGY & ENGINEERING / Electrical, TECHNOLOGY & ENGINEERING / Materials Science / Electronic Materials WIDTH: 155 cm SPINE:

      Book Themes:

      Engineering applications of electronic, magnetic, optical materials, Electrical engineering

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      This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
      Format: Paperback / softback CONTRIBUTORS: Lawrence C. Wagner EAN: 9781461372318 COUNTRY: United States PAGES: WEIGHT: 421 g HEIGHT: 235 cm
      PUBLISHED BY: Springer-Verlag New York Inc. DATE PUBLISHED: 2012-11-09 CITY: GENRE: TECHNOLOGY & ENGINEERING / Electrical, TECHNOLOGY & ENGINEERING / Materials Science / Electronic Materials WIDTH: 155 cm SPINE:

      Book Themes:

      Engineering applications of electronic, magnetic, optical materials, Electrical engineering

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      Be the first to write a review
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