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International Conference on Extreme Ultraviolet Lithography 2018

Kurt Ronse
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      Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
      Format: Paperback / softback CONTRIBUTORS: Kurt Ronse EAN: 9781510622135 COUNTRY: United States PAGES: WEIGHT: 0 g HEIGHT: 279 cm
      PUBLISHED BY: SPIE Press DATE PUBLISHED: 2019-02-28 CITY: GENRE: TECHNOLOGY & ENGINEERING / Optics WIDTH: 216 cm SPINE:

      Book Themes:

      Applied optics

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      Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
      Format: Paperback / softback CONTRIBUTORS: Kurt Ronse EAN: 9781510622135 COUNTRY: United States PAGES: WEIGHT: 0 g HEIGHT: 279 cm
      PUBLISHED BY: SPIE Press DATE PUBLISHED: 2019-02-28 CITY: GENRE: TECHNOLOGY & ENGINEERING / Optics WIDTH: 216 cm SPINE:

      Book Themes:

      Applied optics

      Customer Reviews

      Be the first to write a review
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