This handbook introduces speckle techniques to nonspecialists to help them understand the basic principles of speckle interferometry. The book mainly focuses on the use of speckle patterns with direct phase-measuring methods that produce an instantaneous phase. The major electronic speckle pattern interferometry (ESPI) techniques are presented using simplified mathematical notation that includes rigid-body and standard-body displacements to estimate object pose changes with six degrees of freedom. Additionally, the adoption of temporal phase unwrapping instead of spatial phase unwrapping is promoted. This handbook also includes a summary of recent industrial applications, with an update on current research in the ESPI field.
Format: Paperback / softback
CONTRIBUTORS: Abundio Dávila
EAN: 9781510645387
COUNTRY: United States
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WEIGHT: 229 g
HEIGHT: 0 cm
PUBLISHED BY: SPIE Press
DATE PUBLISHED: 2022-02-01
CITY:
GENRE: TECHNOLOGY & ENGINEERING / Imaging Systems
WIDTH: 0 cm
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Book Themes:
Imaging systems and technology