This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.
Format: Hardback
CONTRIBUTORS: David S. Simon
EAN: 9783319465494
COUNTRY: Switzerland
PAGES:
WEIGHT: 5561 g
HEIGHT: 235 cm
PUBLISHED BY: Springer International Publishing AG
DATE PUBLISHED: 2016-12-08
CITY:
GENRE: COMPUTERS / Information Technology, SCIENCE / Physics / Optics & Light, SCIENCE / Physics / Quantum Theory
WIDTH: 155 cm
SPINE:
Book Themes:
Condensed matter physics (liquid state and solid state physics), Optical physics, Quantum physics (quantum mechanics and quantum field theory), Materials science
David Simon. Professor, Stonehill College, Easton MA 02357, USA Gregg Jaeger, Professor, Boston University, Boston MA 02215, USA Alexander V. Sergienko, Boston University, Boston MA 02215, USA
