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    Pattern Analysis and Machine Intelligence

Pattern Analysis and Machine Intelligence

Jie Yang
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      This book constitutes the referred proceedings of the First International Conference on Pattern Analysis and Machine Intelligence, ICPAMI 2024, held in Shanghai, China, from August 30 to September 01, 2024.The 28 papers presented here were carefully reviewed and selected from 56 submissions. These papers have been organized under the following topical sections: Computer Vision and Pattern Recognition; Natural Language Processing (NLP) and Machine Learning; Intelligent System and Optimization Algorithm.

      Format: Paperback / softback CONTRIBUTORS: Jie Yang EAN: 9789819633487 COUNTRY: Switzerland PAGES: 238 WEIGHT: HEIGHT: 235 mm
      PUBLISHED BY: Springer Nature Switzerland AG DATE PUBLISHED: 2025-03-27 CITY: GENRE: COMPUTERS / Artificial Intelligence / Computer Vision & Pattern Recognition, COMPUTERS / Optical Data Processing, COMPUTERS / Data Science / Machine Learning, TECHNOLOGY & ENGINEERING / Electronics / General WIDTH: 155 mm SPINE:

      Book Themes:

      Electronics engineering, Machine learning, Pattern recognition, Computer vision, Image processing

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      This book constitutes the referred proceedings of the First International Conference on Pattern Analysis and Machine Intelligence, ICPAMI 2024, held in Shanghai, China, from August 30 to September 01, 2024.The 28 papers presented here were carefully reviewed and selected from 56 submissions. These papers have been organized under the following topical sections: Computer Vision and Pattern Recognition; Natural Language Processing (NLP) and Machine Learning; Intelligent System and Optimization Algorithm.

      Format: Paperback / softback CONTRIBUTORS: Jie Yang EAN: 9789819633487 COUNTRY: Switzerland PAGES: 238 WEIGHT: HEIGHT: 235 mm
      PUBLISHED BY: Springer Nature Switzerland AG DATE PUBLISHED: 2025-03-27 CITY: GENRE: COMPUTERS / Artificial Intelligence / Computer Vision & Pattern Recognition, COMPUTERS / Optical Data Processing, COMPUTERS / Data Science / Machine Learning, TECHNOLOGY & ENGINEERING / Electronics / General WIDTH: 155 mm SPINE:

      Book Themes:

      Electronics engineering, Machine learning, Pattern recognition, Computer vision, Image processing

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