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    Recent Advances in Life-Testing and Reliability

Recent Advances in Life-Testing and Reliability

N. Balakrishnan, H. Leon Harter, Jon E. Anderson, Ananda Sen, Claudio Benski, William Q. Meeker, Philip Prescott, Richard L. Smith, J.R.M. Hosking, Gary C. McDonald
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      This unique volume presents chapters written on the areas of life-testing and reliability by many well-known researchers who have contributed significantly to these two areas over the years. Chapters cover a wide range of topics such as inference under censoring and truncation, reliability growth models, designs to improve quality, prediction techniques, Bayesian analysis of reliability, multivariate methods, accelerated testing, and more. The book is written in an easy-to-follow style, first presenting the necessary theoretical details and then illustrating the methods with a numerical examples wherever possible. Many tables and graphs that are essential for the use of some of the new methodologies are presented throughout the volume. Numerous examples provide the reader with a clear understanding of the methods presented as well as with insight into the applications of these results.
      Format: CONTRIBUTORS: N. Balakrishnan, H. Leon Harter, Jon E. Anderson, Ananda Sen, Claudio Benski, William Q. Meeker, Philip Prescott, Richard L. Smith, J.R.M. Hosking, Gary C. McDonald EAN: 9780849389726 COUNTRY: United States PAGES: WEIGHT: 1400 g HEIGHT: 246 cm
      PUBLISHED BY: Taylor & Francis Inc DATE PUBLISHED: 1995-04-27 CITY: GENRE: MATHEMATICS / Probability & Statistics / General WIDTH: 174 cm SPINE:

      Book Themes:

      Production and quality control management, Probability and statistics, Engineering: general, Environmental science, engineering and technology

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      Balakrishnan\, N.
      This unique volume presents chapters written on the areas of life-testing and reliability by many well-known researchers who have contributed significantly to these two areas over the years. Chapters cover a wide range of topics such as inference under censoring and truncation, reliability growth models, designs to improve quality, prediction techniques, Bayesian analysis of reliability, multivariate methods, accelerated testing, and more. The book is written in an easy-to-follow style, first presenting the necessary theoretical details and then illustrating the methods with a numerical examples wherever possible. Many tables and graphs that are essential for the use of some of the new methodologies are presented throughout the volume. Numerous examples provide the reader with a clear understanding of the methods presented as well as with insight into the applications of these results.
      Format: CONTRIBUTORS: N. Balakrishnan, H. Leon Harter, Jon E. Anderson, Ananda Sen, Claudio Benski, William Q. Meeker, Philip Prescott, Richard L. Smith, J.R.M. Hosking, Gary C. McDonald EAN: 9780849389726 COUNTRY: United States PAGES: WEIGHT: 1400 g HEIGHT: 246 cm
      PUBLISHED BY: Taylor & Francis Inc DATE PUBLISHED: 1995-04-27 CITY: GENRE: MATHEMATICS / Probability & Statistics / General WIDTH: 174 cm SPINE:

      Book Themes:

      Production and quality control management, Probability and statistics, Engineering: general, Environmental science, engineering and technology

      Customer Reviews

      Be the first to write a review
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      Balakrishnan\, N.

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