FREE delivery to all EXCLUSIVE BOOKS stores nationwide. FREE delivery to your door on all orders over R450. Excludes all international deliveries.

  • Safe delivery by Christmas SANTA SAFE
    Novel Algorithms for Fast Statistical Analysis of Scaled Circuits

Novel Algorithms for Fast Statistical Analysis of Scaled Circuits

Amith Singhee
    Product form
      FORMAT: Paperback / softback

      R 4,030.00 Price and availability exclusive to website

      YOU COULD EARN 4,030 FUTURE RETAIL DISCOUNTS.
      ESTIMATED DELIVERY: Approx. 20 - 30 Business Days
      BUY NOW PAY LATER
      From R 671.66 per month!
      3x monthly payments of R 1,343.33 with
      4x fortnightly payments of R 1,007.50 with
      As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably slow. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits draws upon ideas for attacking parallel problems in other technical fields, such as computational finance, machine learning and actuarial risk, and synthesizes them with innovative attacks for the problem domain of integrated circuits. The result is a set of novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime.
      Format: Paperback / softback CONTRIBUTORS: Amith Singhee EAN: 9789400736870 COUNTRY: Netherlands PAGES: WEIGHT: 454 g HEIGHT: 235 cm
      PUBLISHED BY: Springer DATE PUBLISHED: 2012-03-07 CITY: GENRE: COMPUTERS / Data Science / Data Modeling & Design, COMPUTERS / Hardware / Cell Phones & Devices, TECHNOLOGY & ENGINEERING / Electronics / Circuits / General WIDTH: 155 cm SPINE:

      Book Themes:

      Electronics: circuits and components, Databases, Systems analysis and design

      Customer Reviews

      Be the first to write a review
      0%
      (0)
      0%
      (0)
      0%
      (0)
      0%
      (0)
      0%
      (0)
      As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably slow. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits draws upon ideas for attacking parallel problems in other technical fields, such as computational finance, machine learning and actuarial risk, and synthesizes them with innovative attacks for the problem domain of integrated circuits. The result is a set of novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime.
      Format: Paperback / softback CONTRIBUTORS: Amith Singhee EAN: 9789400736870 COUNTRY: Netherlands PAGES: WEIGHT: 454 g HEIGHT: 235 cm
      PUBLISHED BY: Springer DATE PUBLISHED: 2012-03-07 CITY: GENRE: COMPUTERS / Data Science / Data Modeling & Design, COMPUTERS / Hardware / Cell Phones & Devices, TECHNOLOGY & ENGINEERING / Electronics / Circuits / General WIDTH: 155 cm SPINE:

      Book Themes:

      Electronics: circuits and components, Databases, Systems analysis and design

      Customer Reviews

      Be the first to write a review
      0%
      (0)
      0%
      (0)
      0%
      (0)
      0%
      (0)
      0%
      (0)

      Recently viewed products

      Login

      Forgot your password?

      Don't have an account yet?
      Create account