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Electromigration and Electronic Device Degradation

A Christou
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      Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.
      Format: CONTRIBUTORS: A Christou EAN: 9780471584896 COUNTRY: United States PAGES: WEIGHT: 680 g HEIGHT: 240 cm
      PUBLISHED BY: John Wiley & Sons Inc DATE PUBLISHED: 1994-02-07 CITY: GENRE: TECHNOLOGY & ENGINEERING / Electronics / Circuits / General WIDTH: 160 cm SPINE:

      Book Themes:

      Electricity, electromagnetism and magnetism, Reliability engineering, Communications engineering / telecommunications, Computer science

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      Aris Christou is the author of Electromigration and Electronic Device Degradation, published by Wiley.
      Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.
      Format: CONTRIBUTORS: A Christou EAN: 9780471584896 COUNTRY: United States PAGES: WEIGHT: 680 g HEIGHT: 240 cm
      PUBLISHED BY: John Wiley & Sons Inc DATE PUBLISHED: 1994-02-07 CITY: GENRE: TECHNOLOGY & ENGINEERING / Electronics / Circuits / General WIDTH: 160 cm SPINE:

      Book Themes:

      Electricity, electromagnetism and magnetism, Reliability engineering, Communications engineering / telecommunications, Computer science

      Customer Reviews

      Be the first to write a review
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      Aris Christou is the author of Electromigration and Electronic Device Degradation, published by Wiley.

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