FREE delivery to all EXCLUSIVE BOOKS stores nationwide. FREE delivery to your door on all orders over R450. Excludes all international deliveries.

Soft Error Mechanisms, Modeling and Mitigation

Selahattin Sayil
    Product form
      FORMAT: Paperback / softback

      R 1,917.74 Price and availability exclusive to website

      YOU COULD EARN 1,917.74 FUTURE RETAIL DISCOUNTS.
      ESTIMATED DELIVERY: Approx. 10 - 15 Business Days
      BUY NOW PAY LATER
      From R 319.62 per month!
      3x monthly payments of R 639.24 with
      4x fortnightly payments of R 479.43 with
      This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.  
      Format: Paperback / softback CONTRIBUTORS: Selahattin Sayil EAN: 9783319808482 COUNTRY: Switzerland PAGES: WEIGHT: 454 g HEIGHT: 235 cm
      PUBLISHED BY: Springer International Publishing AG DATE PUBLISHED: 2018-06-15 CITY: GENRE: COMPUTERS / Computer Architecture, TECHNOLOGY & ENGINEERING / Electronics / Circuits / General WIDTH: 155 cm SPINE:

      Book Themes:

      Electronics: circuits and components, Mainframes and minicomputers, Computer architecture and logic design

      Customer Reviews

      Be the first to write a review
      0%
      (0)
      0%
      (0)
      0%
      (0)
      0%
      (0)
      0%
      (0)
      Dr. Selahattin Sayil is an Associate Professor in the Philip M. Drayer Department of Electrical Engineering at Lamar University.  His research focuses on Radiation effects modeling and hardening at the circuit level, Reliability analysis of low power designs, and Interconnect modeling and noise prediction.
      This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.  
      Format: Paperback / softback CONTRIBUTORS: Selahattin Sayil EAN: 9783319808482 COUNTRY: Switzerland PAGES: WEIGHT: 454 g HEIGHT: 235 cm
      PUBLISHED BY: Springer International Publishing AG DATE PUBLISHED: 2018-06-15 CITY: GENRE: COMPUTERS / Computer Architecture, TECHNOLOGY & ENGINEERING / Electronics / Circuits / General WIDTH: 155 cm SPINE:

      Book Themes:

      Electronics: circuits and components, Mainframes and minicomputers, Computer architecture and logic design

      Customer Reviews

      Be the first to write a review
      0%
      (0)
      0%
      (0)
      0%
      (0)
      0%
      (0)
      0%
      (0)
      Dr. Selahattin Sayil is an Associate Professor in the Philip M. Drayer Department of Electrical Engineering at Lamar University.  His research focuses on Radiation effects modeling and hardening at the circuit level, Reliability analysis of low power designs, and Interconnect modeling and noise prediction.

      Recently viewed products

      Login

      Forgot your password?

      Don't have an account yet?
      Create account